| 出版年月 |
著作類別 |
著作名稱 |
作者 |
收錄出處 |
| 2025-10 |
期刊論文
|
Surgical video-based temporal action analysis algorithm and competency assessment in laparoscopic cholecystectomy: development and exploratory evaluation |
Hung-Hsuan Yen, Ming-Chih Ho, Meng-Han Yang, Yi-Hsiang Hsiao, Hsiang-Wei Huang, Jia-Yuan Huang, Chun-Chieh Huang, Jakey Blue |
Surgical Endoscopy
|
| 2025-09 |
研討會論文
|
Autonomous persona generation: leveraging agentic AI for scalable, adaptive user simulation |
You-Hua Wu, Freda Shao, Jakey Blue |
|
| 2025-09 |
研討會論文
|
Evaluating personality consistency in large language models via big five inventories and dual-enhanced networks |
Yi-Ting Hou, Freda Shao, Jakey Blue |
|
| 2025-04 |
研討會論文
|
Deep ensembled incremental learning method for process drift detection and adaptation |
Huai-Wei Wang, Jakey Blue |
|
| 2025-03 |
期刊論文
|
Automated surgical action recognition and competency assessment in laparoscopic cholecystectomy: a proof-of-concept study |
Hung-Hsuan Yen, Yi-Hsiang Hsiao, Meng-Han Yang, Jia-Yuan Huang, Hsu-Ting Lin, Chun-Chieh Huang, Jakey Blue, Ming-Chih Ho |
Surgical Endoscopy
|
| 2025-03 |
研討會論文
|
An explainable robotic process automation (XRPA) framework of window-based PCA with eigenvector calibration for manufacturing diagnostics |
Kantanat Chaisukjaroenkul, Jakey Blue |
|
| 2024-12 |
研討會論文
|
Predictive equipment state based on hidden Markov model and production plan |
Dean Chu, Jakey Blue, Stéphane Dauzère-Pérès |
|
| 2024-06 |
研討會論文
|
An explainable framework of concept extraction and its sequential interpretability for image classification models |
Shao-Yin Lin, Jakey Blue |
|
| 2024-04 |
研討會論文
|
On the development of data augmentation techniques and analytical framework for continuous & categorical type variables |
Ting-Wei Wu, Jakey Blue |
|
| 2023-09 |
研討會論文
|
Dynamic Bayesian network-based run-to-run control scheme for optimal quality engineering in semiconductor manufacturing |
Wei-Ting Yang, Jakey Blue |
|
| 2023-09 |
研討會論文
|
Predicting Indocyanine Green Retention at 15 Minutes (ICG15) in hepatocellular carcinoma patients using radiomics and hematology |
Pei-Chun Chao, Jakey Blue |
|
| 2022-12 |
研討會論文
|
Equipment prognosis with ghost point resampling method under imbalanced data restriction |
Rifa Budhianto, Jakey Blue |
|
| 2021-02 |
期刊論文
|
Equipment deterioration modeling and cause diagnosis in semiconductor manufacturing |
Hamideh Rostami, Jakey Blue, Argon Chen, Claude Yugma |
International Journal of Intelligent Systems
|
| 2020-10 |
期刊論文
|
A physics-informed run-to-run control for semiconductor manufacturing |
Wei-Ting Yang, Jakey Blue, Agnès Roussy, Jacques Pinaton, Macro S. Reis |
Expert Systems With Applications
|
| 2020-10 |
研討會論文
|
Bayesian Network-based Interpretability on the Deep Neural Nets |
Anna Yang, Jakey Blue, Wilson Cheng |
|
| 2020-07 |
期刊論文
|
A structure data driven framework for virtual metrology modeling |
Wei-Ting Yang, Jakey Blue, Agnès Roussy, Jacques Pinaton, Macro S. Reis |
IEEE Transactions on Automation Sciences and Engineering
|
| 2020-01 |
期刊論文
|
Chamber-to-chamber discrepancy detection in semiconductor manufacturing |
Aabir Chouichi, Jakey Blue, Claude Yugma, François Pasqualini |
IEEE Transactions on Semiconductor Manufacturing
|
| 2019-12 |
研討會論文
|
Convolutional correlation structure monitoring for batch process diagnosis |
Jakey Blue |
|
| 2019-04 |
研討會論文
|
Chamber mismatching calibration with adjusted run-to-run regulation in semiconductor manufacturing |
Aabir Chouichi, Jakey Blue, Claude Yugma, François Pasqualini |
|
| 2018-12 |
研討會論文
|
The detection and the control of machine/chamber mismatching in semiconductor manufacturing |
Aabir Chouichi, Jakey Blue, Claude Yugma, François Pasqualini |
|
| 2018-12 |
研討會論文
|
Virtual metrology modeling based on Gaussian Bayesian network |
Wei-Ting Yang, Jakey Blue, Agnès Roussy, Marco Reis, Jacques Pinaton |
|
| 2018-09 |
研討會論文
|
Metrology modeling based on process parameters in semiconductor manufacturing |
Aabir Chouichi, Jakey Blue, Claude Yugma, François Pasqualini |
|
| 2018-09 |
研討會論文
|
Run-to-run control based on Gaussian Bayesian network in semiconductor manufacturing |
Wei-Ting Yang, Jakey Blue, Agnès Roussy, Marco Reis, Jacques Pinaton |
|
| 2018-08 |
研討會論文
|
Equipment deterioration modeling and causes diagnosis in semiconductor manufacturing |
Hamideh Rostami, Jakey Blue, Argon Chen, Claude Yugma |
|
| 2018-08 |
研討會論文
|
The light behavior from Shallow Trench Isolation profiles at Chemical Mechanical Planarization step and correlation with optical endpoint system by interferometry |
Sophia Bourzgui, Gaëlle Georges, Agnès Roussy, Jakey Blue, Emilie Faivre, Jacques Pinaton |
|
| 2018-07 |
期刊論文
|
Automatic equipment fault fingerprint extraction for the fault diagnostic on the batch process data |
Hamideh Rostami, Jakey Blue, Claude Yugma |
Applied Soft Computing
|
| 2018-07 |
研討會論文
|
Single machine scheduling with consideration of preventive maintenance and machine health |
Kwei-Long Huang, Jakey Blue, Hao-Chen Weng, Shu-Han Liu |
|
| 2018-06 |
期刊論文
|
Impact of integrating equipment health in production scheduling for semiconductor fabrication |
Yu-Ting Kao, Stéphane Dauzère-Pérès, Jakey Blue, Shi-Chung Chang |
Computers & Industrial Engineering
|
| 2018-05 |
研討會論文
|
Advanced R2R controller in semiconductor manufacturing with real-time equipment condition |
Wei-Ting Yang, Jakey Blue, Agnès Roussy, Marco Reis |
|
| 2018-05 |
研討會論文
|
Heterogranular multivariate analytics for detecting and controlling the root causes of the mismatching machines in semiconductor manufacturing |
Aabir Chouichi, Jakey Blue, Claude Yugma, François Pasqualini |
|
| 2018-04 |
研討會論文
|
FDC-based equipment deterioration modeling and the root cause identification in semiconductor industry |
Hamideh Rostami, Jakey Blue, Claude Yugma |
|
| 2018-04 |
研討會論文
|
Temporal convolutional features consolidated as a virtual SVID for process diagnosis |
Jakey Blue, Jacques Pinaton |
|
| 2018-02 |
研討會論文
|
Heterogranular multivariate analytics for detecting and controlling the root causes of the mismatching machines in semiconductor manufacturing |
Aabir Chouichi, Jakey Blue, Claude Yugma, François Pasqualini |
|
| 2018-02 |
研討會論文
|
Manifold dimension reduction of FDC data as the unsupervised fault diagnosis in semiconductor manufacturing |
Jakey Blue, Jacques Pinaton |
|
| 2017-11 |
期刊論文
|
Key effects and process parameters extraction on the CD of Reactive Ion Etching (RIE) based on DOE Modelling |
Maria Rizquez, Agnès Roussy, Jakey Blue, Laurent Bucelle, Jacques Pinaton, Julien Pasquet |
IEEE Transactions on Semiconductor Manufacturing
|
| 2017-10 |
研討會論文
|
Device pattern impact on optical endpoint detection by interferometry for STI CMP |
Sophia Bourzgui, Agnès Roussy, Jakey Blue, Gaëlle Georges, Emilie Faivre, Karen Labory, Agnès Allard |
|
| 2017-10 |
研討會論文
|
Equipment health diagnosis and prognosis using a wavelet-based windowing approach in semiconductor manufacturing |
Hamideh Rostami, Jakey Blue, Claude Yugma |
|
| 2017-09 |
研討會論文
|
Advanced Run-to-Run controller in semiconductor manufacturing with real-time equipment condition |
Wei-Ting Yang, Jakey Blue, Agnès Roussy, Marco Reis |
|
| 2017-09 |
研討會論文
|
Heterogranular multivariate analytics for detecting and controlling the root causes of the mismatching machines in semiconductor manufacturing |
Aabir Chouichi, Jakey Blue, Claude Yugma, François Pasqualini |
|
| 2017-05 |
研討會論文
|
Embedded spectroscopic reflectometry metrology on FEOL silicon dioxide trench polishing equipment |
Sophia Bourzgui, Agnès Roussy, Jakey Blue, Gaëlle Georges, Emilie Faivre, Karen Labory, Jacques Pinaton |
|
| 2017-05 |
研討會論文
|
Equipment health modeling for deterioration prognosis and fault signatures diagnosis |
Hamideh Rostami, Jakey Blue, Claude Yugma |
|
| 2017-04 |
期刊論文
|
Translation invariant multiscale energy-based PCA (TIME-PCA) for monitoring batch processes in semiconductor manufacturing |
Tiago J. Rato, Jakey Blue, Jacques Pinaton, Macro S. Reis |
IEEE Transactions on Automation Sciences and Engineering
|
| 2017-04 |
研討會論文
|
Equipment deterioration prognosis and fault diagnosis in semiconductor manufacturing |
Hamideh Rostami, Jakey Blue, Claude Yugma |
|
| 2016-12 |
研討會論文
|
Equipment anomaly detection and automatic fault fingerprint extraction in semiconductor manufacturing |
Hamideh Rostami, Jakey Blue, Claude Yugma |
|
| 2016-12 |
研討會論文
|
Generalized overall equipment effectiveness for integrated scheduling and process control |
Yu-Ting Kao, Shi-Chung Chang, Jakey Blue, Stéphane Dauzère-Pérès |
|
| 2016-12 |
研討會論文
|
Run-to-Run sensor variation monitoring for process fault diagnosis in semiconductor manufacturing |
Jakey Blue, Jacques Pinaton, Agnès Roussy |
|
| 2016-09 |
研討會論文
|
Opportunity for improving fab effectiveness by Predictive Overall Equipment Effectiveness (POEE) |
Yu-Ting Kao, Shi-Chung Chang, Stéphane Dauzère-Pérès, Jakey Blue |
|
| 2016-08 |
研討會論文
|
Equipment anomaly detection and automatic fault fingerprint extraction in semiconductor manufacturing |
Hamideh Rostami, Jakey Blue, Claude Yugma |
|
| 2016-04 |
研討會論文
|
Integrating equipment health in job shop scheduling for semiconductor fabrication |
Yu-Ting Kao, Stéphane Dauzère-Pérès, Jakey Blue |
|
| 2015-09 |
研討會論文
|
Translation invariant multiscale energy-based PCA (TIME-PCA) for monitoring batch processes in semiconductor manufacturing |
Tiago Rato, Jakey Blue, Jacques Pinaton, Marco Reis |
|
| 2015-09 |
研討會論文
|
Wafer spatial pattern decomposition and diagnosis based on processing characteristics |
Espéran Padonou, Jakey Blue |
|
| 2015-05 |
研討會論文
|
Spatial risk assessment on circular domains: application to wafer profile monitoring |
Espéran Padonou, Olivier Roustant, Jakey Blue, Duverneuil Hugues |
|
| 2015-04 |
期刊論文
|
Integration of scheduling and advanced process control in semiconductor manufacturing: review and outlook |
Claude Yugma, Jakey Blue, Stéphane Dauzère-Pérès, Ali Obeid |
Journal of Scheduling
|
| 2015-04 |
研討會論文
|
FDC-based equipment deterioration modelling |
Jakey Blue, Jacques Pinaton |
|
| 2014-09 |
研討會論文
|
Response surface approximation for profile monitoring in circular domains |
Espéran Padonou, Jakey Blue, Olivier Roustant, Duverneuil Hugues |
|
| 2014-09 |
研討會論文
|
Run-to-run profile monitoring on sensor temporal data for tool condition diagnosis |
Jakey Blue, Agnès Roussy, Jacques Pinaton |
|
| 2014-08 |
研討會論文
|
Integration of scheduling and advanced process control in semiconductor manufacturing: review and outlook |
Claude Yugma, Jakey Blue, Stéphane Dauzère-Pérès, Philippe Vialletelle |
|
| 2014-05 |
研討會論文
|
FDC R2R variation monitoring for sensor level diagnosis in tool condition hierarchy |
Jakey Blue, Agnès Roussy, Jacques Pinaton |
|
| 2013-02 |
期刊論文
|
Tool condition diagnosis with a recipe-independent hierarchical monitoring scheme |
Jakey Blue, Dietmar Gleispach, Agnès Roussy, Peter Scheibelhofer |
IEEE Transactions on Semiconductor Manufacturing
|
| 2012-05 |
研討會論文
|
Efficient FDC based on hierarchical tool condition monitoring scheme |
Jakey Blue, Agnès Roussy, Alexis Thieullen, Jacques Pinaton |
|
| 2012-04 |
研討會論文
|
Hierarchical Monitor Scheme for Recipe-independent Tool Condition Evaluation. One approach of EHF (Equipment Health Factor) |
Dietmar Gleispach, Jakey Blue, Haselmann Matthias |
|
| 2011-01 |
期刊論文
|
Spatial Variance Spectrum Analysis and Its Application to Unsupervised Detection of Systematic Wafer Spatial Variations |
Jakey Blue, Argon Chen |
IEEE Transactions on Automation Science and Engineering
|
| 2010-07 |
期刊論文
|
Performance analysis of demand planning approaches for aggregating, forecasting and disaggregating interrelated demands |
Argon Chen, Jakey Blue |
International Journal of Production Economics
|
| 2009-08 |
研討會論文
|
Optimum sampling for track PEB CD integrated metrology |
Argon Chen, Han Sean Hsueh, Jakey Blue |
|
| 2009-07 |
期刊論文
|
Recipe-Independent Indicator for Tool Health Diagnosis and Predictive Maintenance |
Argon Chen, Jakey Blue |
IEEE Transactions on Semiconductor Manufacturing
|
| 2007-05 |
期刊論文
|
Demand planning approaches to aggregating and forecasting interrelated demands for safety stock and backup capacity planning |
Argon Chen, Chia-Hao Hsu, Jakey Blue |
International Journal of Production Research
|
主要學歷