| 出版年月 |
著作類別 |
著作名稱 |
作者 |
收錄出處 |
| 2026-04 |
期刊論文
|
Enhancing Inspection Efficiency in High-Quality Environments Using a Process Capability-Based Skip-Lot Sampling Strategy |
Chien-Wei Wu and Shih-Wen Liu* |
International Journal of Production Research (SCIE Q1)
|
| 2026-01 |
期刊論文
|
The Effect of Entrepreneurial Passion and Entrepreneurial Education on Entrepreneurial Intention through Entrepreneurial Mindset among Students at Universitas Negeri Surabaya |
Krista Suci Reffandi, Waspodo Tjipto Subroto, Dwi Yuli Rakhmawati* and Shih-Wen Liu |
Jurnal Ekonomi Pendidikan dan Kewirausahaan
|
| 2025-11 |
研討會論文
|
A variables skipping inspection for lot decision based on high-level process yield |
Shih-Wen Liu*, Chien-Wei Wu and Zih-Huei Wang |
|
| 2025-11 |
研討會論文
|
Evaluating Supplier Performance Using Process Capability Indices Under Non-normal Distributions: A Nonparametric Approach |
Shih-Wen Liu |
|
| 2025-04 |
期刊論文
|
Enhancing lot sentencing through a capability index‐based skip‐lot sampling scheme |
Shih-Wen Liu, Chien-Wei Wu* and I-Ting Wei |
Quality and Reliability Engineering International (SCIE Q2)
|
| 2025-04 |
研討會論文
|
A Modified Approach to Economic Lot Disposition |
Chih-Mo Lee, Chien-Wei Wu and Shih-Wen Liu* |
|
| 2025-04 |
研討會論文
|
Manufacturing Performance Estimation based on Non-Parametric Methods |
Chien-Ho Lin, Kun-Ying Li and Shih-Wen Liu* |
|
| 2025-03 |
期刊論文
|
Developing a stage-independent multiple sampling plan with loss-based capability index for lot disposition |
Chien-Wei Wu, Armin Darmawan, Shih-Wen Liu |
Journal of the Operational Research Society (SCIE Q2)
|
| 2024-08 |
研討會論文
|
An improved two-stage partial inspection strategy for lot determination based on process yield |
Chien-Wei Wu and Shih-Wen Liu* |
|
| 2024-06 |
期刊論文
|
An efficient partial sampling inspection for lot sentencing based on process yield |
Shih-Wen Liu and Chien-Wei Wu* |
Annals of Operations Research (SCIE Q1)
|
| 2024-06 |
研討會論文
|
A flexible mechanism for lot determination based on process yield |
Shih-Wen Liu |
|
| 2024-04 |
研討會論文
|
A study of Cpk-based repetitive group sampling plan for lot disposition |
Hung-Yi Tseng and Shih-Wen Liu* |
|
| 2024-04 |
研討會論文
|
Selection of torque motor suppliers using a nonparametric approach |
Chien-Ho Lin and Shih-Wen Liu* |
|
| 2023-11 |
研討會論文
|
Developing a Two-Level Skip-Lot inspection method based on process capability index |
Shih-Wen Liu |
|
| 2023-11 |
研討會論文
|
Machine-learning-based parameter estimation for lifetime distributions |
Shih-Wen Liu |
|
| 2023-07 |
研討會論文
|
Designing a new approach for lot determination based on multiple quality characteristics |
Shih-Wen Liu |
|
| 2023-05 |
期刊論文
|
Stage-independent multiple sampling plan by variables inspection for lot determination based on the process capability index Cpk |
Chien-Wei Wu, Armin Darmawan and Shih-Wen Liu* |
International Journal of Production Research (SCIE Q1)
|
| 2023-04 |
期刊論文
|
Developing a cost-efficient dual sampling system for lot disposition by considering process yield and quality loss |
Shih-Wen Liu, Zih-Huei Wang and To-Cheng Wang* |
Quality Engineering (SCIE Q1)
|
| 2023-04 |
研討會論文
|
An Adaptive Mechanism for Improving Sampling Plans in Lot Sentencing |
Shih-Wen Liu*, Chien-Wei Wu and Zih-Huei Wang |
|
| 2023-03 |
期刊論文
|
A new Spk-based sample-size tightening sampling system for lot determination |
Shih-Wen Liu* and Zih-Huei Wang |
Quality Technology & Quantitative Management (SCIE Q1)
|
| 2023-03 |
研討會論文
|
A new modified repetitive group sampling plan based on unilateral process capability indices |
Zhao-Rui Qiu, Shih-Wen Liu* and Hong-Yi Tseng |
|
| 2023-03 |
研討會論文
|
An improved switch-based sampling system based on process yield |
Shih-Wen Liu |
|
| 2023-03 |
研討會論文
|
An independent sampling inspection method for lot judgment based on process yield |
Yi-Jie Huang and Shih-Wen Liu* |
|
| 2023-01 |
研討會論文
|
A new type of skipping lot sampling plan based on process yield |
Chien-Wei Wu and Shih-Wen Liu* |
|
| 2022-12 |
研討會論文
|
Generalized dual sampling inspection method by considering
multiple quality characteristics |
Shih-Wen Liu* and Chien-Wei Wu |
|
| 2022-12 |
研討會論文
|
建構改良型的計量檢驗重複群集抽樣計畫 |
邱昭瑞、劉時玟* |
|
| 2022-11 |
研討會論文
|
基於製程良率建構獨立型雙次抽樣之貨批判決方法 |
黃羿傑、邱俊智、劉時玟*、邱昭瑞 |
|
| 2022-10 |
期刊論文
|
Yield‐based variables repetitive group plan with a critical‐value‐adjusted mechanism |
Shih-Wen Liu* and Chien-Wei Wu |
Quality and Reliability Engineering International (SCIE Q2)
|
| 2022-08 |
研討會論文
|
An efficient partial inspection method for lot sentencing |
Shih-Wen Liu* and Chien-Wei Wu |
|
| 2022-06 |
期刊論文
|
A repetitive group sampling plan based on the lifetime performance index under gamma distribution |
Chien-Wei Wu, Amy.H.I. Lee* and Shih-Wen Liu |
Quality and Reliability Engineering International (SCIE Q2)
|
| 2022-06 |
研討會論文
|
A new lot sentencing method for products with multiple quality characteristics based on process yield |
Shih-Wen Liu* and Chien-Wei Wu |
|
| 2022-03 |
期刊論文
|
An integrated operating mechanism for lot sentencing based on process yield |
Shih-Wen Liu, CW Wu, Zih-Huei Wang* |
Quality Technology & Quantitative Management (SCIE Q1)
|
| 2022-03 |
期刊論文
|
Designing a Yield-Based Skip-Lot Sampling Plan for Lot Acceptance Determination |
Chien-Wei Wu*, Jr-Tzung Chen and Shih-Wen Liu |
Journal of the Operational Research Society (SCIE Q2)
|
| 2021-11 |
研討會論文
|
A new strategy for lot determination based on process capability index |
Yu-Qi Lee, Chien-Wei Wu and Shih-Wen Liu* |
|
| 2021-11 |
研討會論文
|
Performance evaluation based on process yield index |
Shih-Wen Liu |
|
| 2021-08 |
期刊論文
|
An adjustable inspection scheme for lot sentencing based on one-sided capability indices |
Shih-Wen Liu, Chien-Wei Wu* and Yu Hsiang Tsai |
Applied Mathematical Modelling (SCIE Q1)
|
| 2021-08 |
期刊論文
|
Designing acceptance sampling plans based on the lifetime performance index under gamma distribution |
Chien-Wei Wu, Amy H. I. Lee*, Shih-Wen Liu and Cheng-Hsuan Liu |
The International Journal of Advanced Manufacturing Technology (SCIE Q2)
|
| 2021-07 |
研討會論文
|
Supplier selection based on process yield for contact lens manufacturing industry |
Shih-Wen Liu |
|
| 2021-03 |
研討會論文
|
透過製程良率指標評選優良供應商之研究 |
劉時玟*、黃羿傑 |
|
| 2020-11 |
研討會論文
|
A revised sampling system by variables inspection for lot sentencing |
Shih-Wen Liu |
|
| 2020-11 |
研討會論文
|
Developing a new lot verification system based on process capability index |
劉時玟*、劉宗閔 |
|
| 2020-10 |
研討會論文
|
導入圖形使用者介面系統於貨批判決一以醫療器材廠為例 |
劉宗閔、劉時玟*、黃羿傑 |
|
| 2020-05 |
研討會論文
|
A new switching model for sampling plan based on process yield |
Shih-Wen Liu* and Chien-Wei Wu |
|
| 2019-11 |
研討會論文
|
A study of sampling system with switching rules on sample sizes |
Shih-Wen Liu |
|
| 2019-11 |
研討會論文
|
Constructing a new inspection scheme based on process yield |
Shih-Wen Liu |
|
| 2019-10 |
期刊論文
|
Constructing a two-plan sampling system based on process yield index |
Shih-Wen Liu* and Kuei-Lin Chen |
Journal of Innovation and Business Management
|
| 2019-04 |
期刊論文
|
Design and construction of a variables switch-based sampling system for product acceptance determination |
Chien-Wei Wu*, Shih-Wen Liu, Jr-Tzung Chen, Jhih-Jia Lin |
The International Journal of Advanced Manufacturing Technology (SCIE Q2)
|
| 2018-06 |
期刊論文
|
A new lot sentencing approach by variables inspection based on process yield |
Chien-Wei Wu*, Shih-Wen Liu |
International Journal of Production Research (SCIE Q1)
|
| 2017-12 |
期刊論文
|
Capability-based quick switching sampling system for lot disposition |
Chien-Wei Wu, Amy HI Lee*, Shih-Wen Liu, Mei-Hsu Shih |
Applied Mathematical Modelling (SCIE Q1)
|
| 2017-02 |
期刊論文
|
A situationally sample‐size‐adjusted sampling scheme based on process yield verification |
Chien‐Wei Wu, Ming‐Hung Shu* and Shih‐Wen Liu |
Quality and Reliability Engineering International (SCIE Q2)
|
| 2016-03 |
期刊論文
|
A quick switching sampling system by variables for controlling lot fraction nonconforming |
Shih-Wen Liu and Chien-Wei Wu* |
International Journal of Production Research (SCIE Q1)
|
| 2015-06 |
研討會論文
|
Developing a new variables sampling plan for products with multiple quality characteristics based on process yield |
Shih-Wen Liu* and Chien-Wei Wu |
|
| 2015-02 |
期刊論文
|
Design and construction of a variables multiple dependent state sampling plan based on process yield |
Chien-Wei Wu, Shih-Wen Liu and Amy H.I. Lee* |
European Journal of Industrial Engineering (SCIE Q4)
|
| 2014-07 |
研討會論文
|
A new variables repetitive group sampling plan with consideration of proceeding lot based on process yield |
Chien-Wei Wu* and Shih-Wen Liu |
|
| 2014-06 |
研討會論文
|
A new sampling plan by variables inspection for product acceptance determination |
Chien-Wei Wu* and Shih-Wen Liu |
|
| 2014-06 |
研討會論文
|
A variables quick switching sampling system for controlling lot fraction nonconforming |
Shih-Wen Liu* and Chien-Wei Wu |
|
| 2014-01 |
期刊論文
|
A resubmitted sampling scheme by variables inspection for controlling lot fraction nonconforming |
Shih-Wen Liu, Shi-Woei Lin and Chien-Wei Wu* |
International Journal of Production Research (SCIE Q1)
|
| 2014-01 |
研討會論文
|
A new variables sampling system based on exact sampling distribution |
Jhih-Jia Lin, Chien-Wei Wu* and Shih-Wen Liu |
|
| 2014-01 |
研討會論文
|
Constructing variables resubmitted sampling plan for lot sentencing based on the process yield index |
Shih-Wen Liu, Shi-Woei Lin and Chien-Wei Wu* |
|
| 2013-10 |
期刊論文
|
Developing a sampling plan by variables inspection for controlling lot fraction of defectives |
Chien-Wei Wu* and Shih-Wen Liu |
Applied Mathematical Modelling (SCIE Q1)
|
| 2013-07 |
研討會論文
|
Developing a new variables sampling plan for product acceptance determination based on the process yield |
Chien-Wei Wu*, Shih-Wen Liu and Shi-Woei Lin |
|
| 2013-05 |
期刊論文
|
Design and construction of a variables repetitive group sampling plan for unilateral specification limit |
Shih-Wen Liu and Chien-Wei Wu* |
Communications in Statistics - Simulation and Computation (SCIE Q3)
|
| 2012-11 |
研討會論文
|
Design and construction of a new sampling plan by variables inspection for unilateral specification limit |
Shih-Wen Liu* and Chien-Wei Wu |
|
| 2012-04 |
研討會論文
|
A new lot sentencing method for products with multiple quality characteristics based on process yield |
Shih-Wen Liu and Chien-Wei Wu |
|
| 2012-03 |
研討會論文
|
Developing a modern variables sampling plan indexed through Six sigma quality levels |
Chien-Wei, Wu*, Shih-Wen Liu, Yuan-Du Hsiao and Hwai-En Tseng |
|
專利