| 出版年月 |
著作類別 |
著作名稱 |
作者 |
收錄出處 |
| 2024-01 |
期刊論文
|
Process capability monitoring and change-point analysis for S-type quality characteristic |
Liao, Mou-Yuan*; Wu, Chien-Wei |
Quality Technology & Quantitative Management
|
| 2020-09 |
期刊論文
|
Supplier selection based on normal process yield: the Bayesian inference |
Liao, Mou-Yuan*; Wu, Chien-Wei |
Neural Computing and Applications
|
| 2019-09 |
期刊論文
|
Modified weighted standard deviation index for adequately interpreting a supplier’s lognormal process capability |
Liao, Mou-Yuan*; Pearn, Wen-Lea |
Journal of Engineering Manufacture
|
| 2017-03 |
期刊論文
|
Efficient Technique for Assessing Actual Non-normal Quality Loss: Markov Chain Monte Carlo. |
Liao, Mou-Yuan* |
Quality and Reliability Engineering International
|
| 2017-01 |
期刊論文
|
Assessing S-type Process Quality of Data Involving Batch-to-Batch Variation |
Liao, Mou-Yuan*; Wu, Chien-Wei; Wen, Shu-Hai |
Journal of Testing and Evaluation.
|
| 2016-12 |
期刊論文
|
Markov chain Monte Carlo in Bayesian models for testing gamma and lognormal S-type process qualities. |
Liao, Mou-Yuan* |
International Journal of Production Research
|
| 2016-04 |
期刊論文
|
Testing and Ranking Multiple Wafer Manufacturing Processes with Fuzzy Quality Data |
Wu, Chien-Wei; Liao, Mou-Yuan*; Lin, Chi-Wei; Lin, Tzu-Ling |
Journal of Testing and Evaluation
|
| 2016-03 |
期刊論文
|
Efficient Method for Testing the Batch-Processing Process Yield |
Liao, Mou-Yuan*; Wu, Chien-Wei |
International Journal of Information and Management Science
|
| 2015-09 |
期刊論文
|
Effective Control Chart for Monitoring the Stability of Non-normal Process Capability |
Liao, Mou-Yuan* |
International Journal of Information and Management Sciences
|
| 2015-06 |
期刊論文
|
Process Capability Control Chart for Non-Normal Data-Evidence of On-Going Capability Assessment |
Liao, Mou-Yuan* |
Quality Technology and Quantitative Management
|
| 2015-05 |
期刊論文
|
Assessing the Actual Gamma Process Quality – A Curve-Fitting Approach for Modifying the Non-Normal Flexible Index |
Liao, Mou-Yuan*; Pearn, W.L.; Liu, Yen-Lun |
International Journal of Production Research
|
| 2015-02 |
期刊論文
|
Assessing process incapability when collecting data from multiple batches |
Liao, Mou-Yuan* |
International Journal of Production Research
|
| 2015-01 |
期刊論文
|
Assessing True TFT-LCD Process Quality in the Presence of Unavoidable Measurement Errors |
Liao, Mou-Yuan*; Wu, Chien-Wei; Lin, Chien-Hua |
Journal of Testing and Evaluation
|
| 2014-10 |
期刊論文
|
Fuzzy Nonlinear Programming Approach for Evaluating and Ranking Process Yields with
Imprecise Data |
Wu, Chien-Wei; Liao, Mou-Yuan |
Fuzzy Sets and Systems
|
| 2014-08 |
期刊論文
|
On Ranking Multiple Touch-Screen Panel Suppliers through the CTQ – Applied Fuzzy Techniques for Inspection with Unavoidable Measurement Errors |
Wu, Chien-Wei; Liao, Mou-Yuan*; Lin, Chung-Yang |
Neural Computing and Applications
|
| 2014-05 |
期刊論文
|
A hybrid classification mehod: Using a support vector machine for rule extraction on diabetes diagnosis |
Yang, Chien-Hsin; Liao, Mou-Yuan; Huang, Kuo-Liang |
International Review of Bussiness and Economics
|
| 2014-03 |
期刊論文
|
Fuzzy Estimation for Process Loss Assessment |
Wu, Chien-Wei; Chang, Ying-Chung; Liao, Mou-Yuan* |
Journal of the Chinese Institute of Engineers
|
| 2013-07 |
期刊論文
|
A Study of Theory of Constraints Supply Chain Replenishment System |
Wu, Horng-Huei; Liao, Mou-Yuan; Tsai, Chih-Hung; Tsai, Shih-Chieh; Lu, Min-Jer; Tsai, Tai-Ping |
International Journal of Academic Research in Accounting, Finance and Management Sciences
|
| 2013-06 |
期刊論文
|
Fuzzy Inference to Supplier Evaluation and Selection Based on Quality Index - A Flexible Approach |
Liao, Mou-Yuan*; Wu, Chien-Wei; Wu, Jia-Wei |
Neural Computing & Applications
|
| 2013-05 |
期刊論文
|
Efficient methods for comparing two process yields - strategies on supplier selection |
Wu, Chien-Wei; Liao, Mou-Yuan*; Yang, Tsung-Tse |
International Journal of Production Research
|
| 2012-05 |
期刊論文
|
Generalized Inference for Measuring Process Yield With the Contamination of Measurement Errors - Quality Control for Silicon Wafer Manufacturing Processes in the Semiconductor Industry |
Wu, Chien-Wei; Liao, Mou-Yuan * |
IEEE Transactions on Semiconductor Manufacturing
|
| 2012-04 |
期刊論文
|
An Improved Approach for Constructing Lower Confidence Bound on Process Yield |
Wu, Chien-Wei; Liao, Mou-Yuan*, Chen, James C. |
European Journal of Industrial Engineering
|
| 2011-03 |
期刊論文
|
Two Tests for Supplier Selection Based on Process Yield |
Pearn, W.L.; Liao, Mou-Yuan*; Wu, Chien-Wei; Chu, Y.T. |
Journal of Testing and Evaluation
|
| 2010-10 |
期刊論文
|
Capability Testing Based on Subsamples: A Case on Photolithography Process Control in Wafer Fabrication |
Liao, Mou-Yuan*; Kang, H.Y.; Lee, A.H.I.; Wu, Chien-Wei |
Journal of Testing and Evaluation
|
| 2010-10 |
期刊論文
|
Economic Tolerance Design for Folded Normal Data |
Liao, Mou-Yuan* |
International Journal of Production Research
|
| 2010-08 |
期刊論文
|
Evaluating Process Performance Based on the Incapability Index for Measurements with Uncertainty |
Liao, Mou-Yuan; Wu, Chien-Wei* |
Expert Systems with Applications
|
| 2010-03 |
期刊論文
|
Process Performance Evaluation with Imprecise Information |
Wu, Chien-Wei; Liao, Mou-Yuan*; Shu, Ming-Hung |
Journal of Testing and Evaluation
|
| 2009-08 |
期刊論文
|
Estimating and testing process yield with imprecise data |
Wu, Chien-Wei; Liao, Mou-Yuan |
Expert Systems with Applications
|
| 2009-08 |
期刊論文
|
Photolithography Control in Wafer Fabrication Based on Process Capability Indices with Multiple Characteristics. |
Pearn, Wen-Lea; Kang, H.Y.; Lee,A.H.I.; Liao, Mou-Yuan |
IEEE Transactions on Semiconductor Manufacturing
|
| 2007-04 |
期刊論文
|
Estimating and Testing Process Precision with Presence of Gauge Measurement Errors |
Pearn, Wen-Lea; Liao, Mou-Yuan |
Quality and Quantity
|
| 2006-08 |
期刊論文
|
Selecting a Better Supplier by Testing Unilateral Specification Process Capability Indices Cpl and Cpu |
Leu, C.H.; Liao, Mou-Yuan; Chen K.S. |
American Journal of Mathematical and Management Sciences.
|
| 2006-06 |
期刊論文
|
One-sided Process Capability Assessment in the Presence of Measurement Errors |
Pearn, Wen-Lea; Liao, Mou-Yuan |
Quality & Reliability Engineering International
|
| 2005-08 |
期刊論文
|
Measuring Process Capability Based on Cpk with Gauge Measurement Errors |
Pearn, Wen-Lea; Liao, Mou-Yuan |
Microelectronics Reliability
|
主要學歷