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研究人才詳細資料

出版年月	著作類別	著作名稱	作者	收錄出處
2026-05	期刊論文	Endurance Paradox in Hafnium-Oxide-Based Silicon-Channel Ferroelectric Transistors	Apu Das, Agniva Paul, Mohit Tewari, Zhao-Feng Lou, Yii-Tay Chang, Asim Senapati, Gautham Kumar, Yannick Raffel, Artur Useinov, Niall Tumilty, Tian-Li Wu, Sandip Lashkare, Tarun Agarwal, Min-Hung Lee, and Sourav De	ACS Applied Materials & Interfaces
2026-04	期刊論文	Sub-2 nm equivalent-oxide thickness ferroelectric transistors for cryogenic memory and computing	Apu Das, Asim Senapati, Gautham Kumar, Zhao-Feng Lou, Jonas Müller, Jaskirat Singh Maskeen, Yii-Tay Chang, Mohit Tewari, Ankit Agarwal, Yannick Raffel, Sidhdheswar Maikap, Kuo-Hsing Kao, Tarun Agarwal, Sandip Lashkare, Darsen Lu, Guilhem Larrieu, Min-Hung Lee, and Sourav De	ACS Nano
2025-12	研討會論文	Adaptive FeFET-Based LIF Neuron for Regression Tasks on Spiking Neural Networks	eshasai Chaitanya Gambali, Aditya D. Arkalgud, Sourav De, Ankit Arora
2025-12	研討會論文	Fundamental Insights into Trap Accumulation and Endurance Degradation in HfO2 FeFETs via Low Frequency Noise and Charge Pumping Analysis	Apu Das, Masud Rana SK, Gautham Kumar, Asim Senapati, Ricardo Olivo, Yannick Raffel, Agniva Paul, Konrad Seidel, Andrea Padovani, Bhaswar Chakrabarti, and Sourav De
2025-12	研討會論文	HZO based FeFET with Sub 2-nm Gate Stack as Synapse for Spiking Neural Network	Jaskirat S. Maskeen, Apu Das, Gautham Kumar, Zhao-Feng Lou, Asim Senapati, Agniva Paul, J. Muller, Y.-T. Chang, G. Larrieu, Min-Hung Lee, Sourav De, Sandip Lashkare
2025-12	研討會論文	Reliability of Sub-2 nm EOT FeFETs at Cryogenic Temperatures	Apu Das, Gautham Kumar, Zhao-Feng Lou, J. Muller, Asim Senapati, J. S. Maskeen, Y.-T. Chang, Agniva Paul, Ankit Agarwal, Siddheswar Maikap, Sandip Lashkare, K.-H. Kao, Darsen Lu, G. Larrieu, Min-Hung Lee, Sourav De
2025-11	期刊論文	Long-term reliability of naturally aged hafnium oxide ferroelectric transistors for energy-efficient embedded memory	Asim Senapati, Apu Das, Agniva Paul, Masud Rana Sk, Yannick Raffel, Ricardo Olivo, Padma Srivari, Gautham Kumar, Bhaswar Chakrabarti, Sayani Majumdar, Andrea Padovani, and Sourav De	Cell Reports Physical Science- Cell Press Journal (IF=8.2, Q1)
2025-10	期刊論文	Trapping Dynamics and Endurance in HfO2-FeFETs: An Insight from Charge Pumping	SK Masud Rana, Asim Senapati, Gautham Kumar, Yannick Raffel, Konrad Seidel, Apu Das, Agniva Paul, Maximilian Lederer, Chun Cheng Chen, Andrea Padovani, Bhaswar Chakrabarti, Sourav De	IEEE Electron Device Letters
2025-08	期刊論文	Insights into Oxygen Vacancy Effects on Ferroelectric Behavior of Hafnium Oxide: A Review	Gautham Kumar, Agniva Paul, Apu Das, Guilhem Larrieu, Sourav De	physica status solidi- Wiley
2025-07	期刊論文	Hafnium oxide-based ferroelectric field effect transistors: From materials and reliability to applications in storage-class memory and in-memory computing	Agniva Paul, Gautham Kumar, Apu Das, Guilhem Larrieu, Sourav De	Journal of Applied Physics- AIP Publishing
2025-06	期刊論文	Defect Dynamics in Silicon-Doped HfO2-Based Front-End-of-Line FeFETs: Insights From Low-Frequency Noise on Doping Concentration, Interfaces, and Write Cycling	Yannick Raffel , Daniel Hessler, Gautham Kumar , Associate Member, IEEE, Ricardo Olivo, Luca Pirro, Talha Chohan , Konrad Seidel, Raik Hoffmann, Deepanshi Bhatnagar, Apu Das, Maximilian Lederer , Sourav De , and Johannes Heitmann	IEEE Transactions on Electron Devices
2025-04	期刊論文	Spike-Timing Dependent Learning Dynamics in Silicon-Doped Hafnium-Oxide Based Ferroelectric Field Effect Transistors	Masud Rana Sk, Apu Das, Gautham Kumar, Deepanshi Bhatnagar, Sourodeep Roy, Yannick Raffel, Maximilian Lederer, Konrad Seidel, Sourav De, Bhaswar Chakrabarti	IEEE Journal of the Electron Devices Society
2025-03	研討會論文	Exploring the Potential of Hafnium Oxide-Based Ferroelectric Memories for Next-Generation Storage Class Memories	Sourav De
2025-02	期刊論文	Oxygen vacancy distribution and phase composition in scaled, Hf0. 5Zr0. 5O2-based ferroelectric capacitors	T Iung, L Pérez Ramírez, A Gloskovskii, C Cho, M-Y Lao, S De, T-H Hou, C Lubin, M Gros-Jean, N Barrett	Applied Physics Letters
2024-11	期刊論文	A Homogeneous FeFET-based Time-Domain Compute-in-Memory Fabric for Matrix-Vector Multiplication and Associative Search	Xunzhao Yin, Qingrong Huang, Hamza E Barkam, Franz Müller, Shan Deng, Alptekin Vardar, Sourav De, Zhouhang Jiang, Mohsen Imani, Ulf Schlichtmann, Xiaobo Sharon Hu, Cheng Zhuo, Thomas Kämpfe, Kai Ni	IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
2024-11	期刊論文	Exploring BEOL-Compatible Ferroelectricity in Ultra-Thin Hafnium Zirconium Oxide: Thermal Budget, FTJ Characteristics, and Device Reliability	Chen-Yi Cho, Chui-Yi Chiu, Sourav De, Tuo-Hung Hou	IEEE Journal of the Electron Devices Society
2024-08	研討會論文	FeFET based LIF Neuron with Learnable Threshold and Time Constant	Shubham Pande, Yannick Raffel, Maximilian Lederer, Anjan Chakravorty, Sourav De, Bhaswar Chakrabarti
2024-05	期刊論文	Unraveling the Wake-Up Mechanism in Ultrathin Ferroelectric Hf0.5 Zr0.5O₂: Interfacial Layer Soft Breakdown and Physical Modeling	Cho, Chen-Yi and Chao, Tzu-Yi and Lin, Tzu-Yao and Wang, I-Ting and De, Sourav and Chen, Yu-Sheng and Ong, Yi-Ching and Lin, Yu-De and Yeh, Po-Chun and Hou, Tuo-Hung	IEEE Transactions on Electron Devices
2024-05	研討會論文	Dopant-Dependent Flicker Noise of Hafnium Oxide Ferroelectric Field Effect Transistor	Daniel Hessler, Ricardo Olivo, Konrad Seidel, Raik Hoffmann, Sourav De, Yannick Raffel
2024-05	研討會論文	Enhanced reliability and trapping behavior in ferroelectric FETs under cryogenic conditions	Maximilian Lederer, Franz Müller, Raik Hoffmann, Ricardo Olivo, Yannick Raffel, Shouzhuo Yang, Sourav De, Roman Potjan, Oliver Ostien, Abdelrahman Altawil, Ayse Sünbül, David Lehninger, Thomas Kämpfe, Konrad Seidel
2024-05	研討會論文	Lattice Scattering Related Flicker Noise in Silicon-Doped Hafnium Oxide FeFETs	Daniel Hessler, Ricardo Olivo, Konrad Seidel, Raik Hoffmann, Sourav De, Yannick Raffel
2024-05	研討會論文	Perspective Roadmap of Advanced HfO2-based Ferroelectric Field Effect Transistors	Sourav De, Chen-Yi Cho, Tarek Ali, Writam Banerjee, Lucia Perez Ramirez, Nick Barrett, Sayani Majumder, Tuo-Hung Hou
2024-05	研討會論文	Spike-Time Dependent Plasticity in HfO2-Based Ferroelectric FET Synapses	Masud Rana Sk, Sourodeep Roy, Maximilian Lederer, Yannick Raffel, Luca Pirro, Talha Chohan, Konrad Seidel, Sourav De, Bhaswar Chakrabarti
2024-05	研討會論文	Trade-off Between Thermal Budget and Thickness Scaling: A Bottleneck on Quest for BEOL Compatible Ultra-Thin Ferroelectric Films Sub-5nm	Chui-Yi Chiu, Sourav De, Chen-Yi Cho, Tuo-Hung Hou
2024-05	研討會論文	WKB model of ferroelectric tunnel junctions for memory applications: voltage-dependent screening and electrostriction effects	Deepali Jagga, Sourav De, Artur Useinov
2024-03	研討會論文	Impact of High-K Deposition Process on the Noise Immunity of FeFETs and their Applicability Towards In-Memory-Computing	Yannick Raffel, Ricardo Olivo, Maximilian Lederer, Luca Pirro, Vivek Vivek Parmar, Talha Chohan, David Lehninger, Sourav De, Thomas Kampfe, Konrad Seidel, Manan Suri, Johannes Heitmann
2024-01	期刊論文	Ferroelectric Field Effect Transistors–Based Content-Addressable Storage-Class Memory: A Study on the Impact of Device Variation and High-Temperature Compatibility	Athira Sunil, Masud Rana SK, Maximilian Lederer, Yannick Raffel, Franz Müller, Ricardo Olivo, Raik Hoffmann, Konrad Seidel, Thomas Kämpfe, Bhaswar Chakrabarti, Sourav De	Advanced Intelligent Systems
2023-12	研討會論文	Achieving Excellent Neuromorphic Performance of Si:HfO2-based FeFETs by Interface Fluorination	Y Raffel, S De, R Olivo, S Thunder, R Hoffmann, K Seidel, T Kämpfe, M Lederer
2023-12	研討會論文	Defying Temperature: Reliable Compute-in-Memory in Monolithic 3D using BEOL Ferroelectric TFT	Swetaki Chatterjee, Shubham Kumar, Athira Sunil, Sourav De, David Lehninger, Michael Jank, Thomas Kämpfe, Yogesh Singh Chauhan, Hussam Amrouch
2023-12	研討會論文	Hardware Aware Spiking Neural Network Training and Its Mixed-Signal Implementation for Non-Volatile In-Memory Computing Accelerators	Alptekin Vardar, Aamir Munir, Nellie Laleni, Sourav De, Thomas Kämpfe
2023-12	研討會論文	Low Frequency Defect Analysis Methods in High-K Metal Gate Stacks for Spin-Qubit Application	Y Raffel, R Olivo, M Simon, R Hoffmann, S De, T Kämpfe, K Seidel, M Lederer
2023-07	期刊論文	1f-1t array: Current limiting transistor cascoded fefet memory array for variation tolerant vector-matrix multiplication operation	Masud Rana Sk, Sunanda Thunder, Franz Müller, Nellie Laleni, Yannick Raffel, Maximilian Lederer, Luca Pirro, Talha Chohan, Jing-Hua Hsuen, Tian-Li Wu, Konrad Seidel, Thomas Kämpfe, Sourav De, Bhaswar Chakrabarti	IEEE Transactions on Nanotechnology
2023-07	期刊論文	28 nm high-k-metal gate ferroelectric field effect transistors based synapses—A comprehensive overview	Yannick Raffel, Franz Müller, Sunanda Thunder, Masud Rana Sk, Maximilian Lederer, Luca Pirro, Sven Beyer, Konrad Seidel, Bhaswar Chakrabarti, Thomas Kämpfe, Sourav De	Memories - Materials, Devices, Circuits and Systems
2023-07	期刊論文	Fixed charges at the HfO2/SiO2 interface: Impact on the memory window of FeFET	Masud Rana Sk, Shubham Pande, Franz Müller, Yannick Raffel, Maximilian Lederer, Luca Pirro, Sven Beyer, Konrad Seidel, Thomas Kämpfe, Sourav De, Bhaswar Chakrabarti	Memories-Materials, Devices, Circuits and Systems
2023-07	期刊論文	Importance of temperature dependence of interface traps in high-k metal gate stacks for silicon spin-qubit development	Yannick Raffel, R Olivo, Maik Simon, Leonie Vieler, Raik Hoffmann, Sourav De, Thomas Kämpfe, Konrad Seidel, Maximilian Lederer	Applied Physics Letters
2023-07	研討會論文	The True Cost of Errors in Emerging Memory Devices: A Worst-Case Analysis of Device Errors in IMC for Safety-Critical Applications	Alptekin Vardar, Li Zhang, Saiyam Jain, Shaown Mojumder, Nellie Laleni, Sourav De, Thomas Kämpfe
2023-06	研討會論文	Hafnium oxide-based ferroelectric memories: Are we ready for application?	Konrad Seidel, David Lehninger, Franz Müller, Yannick Raffel, Ayse Sünbül, Ricardo Revello, Raik Hoffmann Sourav De, Thomas Kämpfe, Maximilian Lederer
2023-06	研討會論文	Multi-Level Operation of ferroelectric FET Memory Arrays for Compute-In-Memory Applications	Franz Müller, Sourav De, Maximilian Lederer, Raik Hoffmann, Ricardo Olivo, Thomas Kämpfe, Tarek Ali, Halid Mulaosmanovic, Stefan Dünkel, Johannes Müller, Sven Beyer, Konrad Seidel, Gerald Gerlach
2023-05	期刊論文	A 2-Transistor-2-Capacitor Ferroelectric Edge Compute-in-Memory Scheme With Disturb-Free Inference and High Endurance	Xiaoyang Ma, Shan Deng, Juejian Wu, Zijian Zhao, David Lehninger, Tarek Ali, Konrad Seidel, Sourav De, Xiyu He, Yiming Chen, Huazhong Yang, Vijaykrishnan Narayanan, Suman Datta, Thomas Kämpfe, Qing Luo, Kai Ni, Xueqing Li	IEEE Electron Device Letter
2023-05	專書論文	Low-Power Vertically Stacked One Time Programmable Multibit IGZO-Based BEOL Compatible Ferroelectric TFT Memory Devices with Lifelong Retention for Monolithic 3D-Inference Engine Applications	Sourav De, Sunanda Thunder, David Lehninger, Michael P.M. Jank, Maximilian Lederer, Yannick Raffel, Konrad Seidel, Thomas Kämpfe	Embedded Artificial Intelligence
2023-05	研討會論文	Demonstration of Differential Mode FeFET-Array for multi-precision storage and IMC applications	Vivek Parmar, Franz Müller, Jing-Hua Hsuen, Sandeep Kaur Kingra, Nellie Laleni, Yannick Raffel, Maximilian Lederer, Alptekin Vardar, Konrad Seidel, Tarek Ali, Stefan Dünkel, Tian-Li Beyer, Sven Wu, Thomas Kämpfe, Sourav De, Manan Suri.
2023-05	研討會論文	28nm HKMG 1F-1R2 Multilevel Memory for Inference Engine Application	Sourav De, Franz Müller, Maximilian Lederer, Yannick Raffel, Tarek Ali, Luca Pirro, Stefan Dünkel, Sven Beyer, Konrad Seidel, Thomas Kämpfe
2023-05	研討會論文	Demonstration of Large Polarization in Si-doped HfO2 Metal–Ferroelectric–Insulator–Semiconductor Capacitors with Good Endurance and Retention	Jing-Hua Hsuen, Maximillian Lederer, Lars Kerkhofs, Yannick Raffel, Luca Pirro, Talha Chohan, Thomas Kämpfe, Sourav De, Tian-Li Wu
2023-03	期刊論文	Multilevel operation of ferroelectric fet memory arrays considering current percolation paths impacting switching behavior	Franz Müller, Sourav De, Ricardo Olivo, Maximilian Lederer, Abdelrahman Altawil, Raik Hoffmann, Thomas Kämpfe, Tarek Ali, Stefan Dünkel, Halid Mulaosmanovic, Johannes Müller, Sven Beyer, Konrad Seidel, Gerald Gerlach	IEEE Electron Device Letters
2023-02	期刊論文	Demonstration of Differential Mode FeFET-Array based IMC-Macro for realizing multi-precision mixed-signal AI accelerator	Vivek Parmar, Franz Müller, Jing-Hua Hsuen, Sandeep Kaur Kingra, Nellie Laleni, Yannick Raffel, Maximilian Lederer, Alptekin Vardar, Konrad Seidel, Taha Soliman, Tobias Kirchner, Tarek Ali, Stefan Dünkel, Tian-Li Beyer, Sven Wu, Sourav De, Manan Suri, Thomas Kämpfe	Advanced Intelligent System, Wiley
2023-01	期刊論文	Ferroelectric Content Addressable Memory Cells with IGZO Channel: Impact of Retention Degradation on the Multibit Operation	Masud SK Rana, Sunanda Thunder, David Lehninger, Maximilian Lederer, Yannick Raffel, Michael P M Jank, Thomas Kämpfe, Sourav De, Bhaswar Chakrabarti	ACS Applied Electronics Material, American Chemical Society
2023-01	期刊論文	SPICE compatible semi-empirical compact model for ferroelectric hysteresis	Maximilian Lederer, Ricardo Olivo, Nandakishor Yadav, Sourav De, Konrad Seidel, Lukas M Eng, Thomas Kämpfe	Solid-State Electronics
2022-12	期刊論文	3-d monolithic stacking of complementary-fet on cmos for next generation compute-in-memory sram	Md Aftab Baig, Cheng-Jui Yeh, Shu-Wei Chang, Bo-Han Qiu, Xiao-Shan Huang, Cheng-Hsien Tsai, Yu-Ming Chang, Po-Jung Sung, Chun-Jung Su, Ta-Chun Cho, Sourav De, Darsen Lu, Yao-Jen Lee, Wen-Hsi Lee, Wen-Fa Wu, Wen-Kuan Yeh	IEEE Journal of the Electron Devices Society
2022-12	期刊論文	Demonstration of multiply-accumulate operation with 28 nm fefet crossbar array	Sourav De, Franz Mueller, Nellie Laleni, Maximilian Lederer, Yannick Raffel, Shaown Mojumder, Alptekin Vardar, Sukhrob Abdulazhanov, Tarek Ali, Stefan Dünkel, Sven Beyer, Konrad Seidel, Thomas Kämpfe	IEEE Electron Device Letters
2022-11	期刊論文	28 nm HKMG-based current limited FeFET crossbar-array for inference application	Sourav De, Franz Müller, Sunanda Thunder, Sukhrob Abdulazhanov, Nellie Laleni, Maximilian Lederer, Tarek Ali, Yannick Raffel, Stefan Dünkel, Shaown Mojumder, Alptekin Vardar, Sven Beyer, Konrad Seidel, Thomas Kämpfe	IEEE Transactions on Electron Devices
2022-10	研討會論文	28nm High-K-Metal Gate Ferroelectric Field Effect Transistors Based Artificial Synapses	Sourav De, Yannick Raffel, Sunanda Thunder, Maxilimilian Ledered, Franz Müller, Thomas Kämpfe
2022-10	研討會論文	Interfacial Layer Engineering to Enhance Noise Immunity of FeFETs for IMC Applications	Yannick Raffel, Sunanda Thunder, Lederer Maximilian, Ricardo Olivo, Raik Hoffmann, Luca Pirro, Sven Beyer, Talha Chohan, Po-Tsang Huang, Sourav De, Thomas Kaempfe, Konrad Seidel, Johannes Heitmann
2022-10	研討會論文	Roadmap for Ferroelectric Memory: Challenges and Opportunities for IMC Applications	Sourav De, Maximilian Lederer, Yannick Raffel, Franz Müller, Konrad Seidel, Thomas Kämpfe
2022-09	期刊論文	A Synergistic Approach of Interfacial Layer Engineering and READ-Voltage Optimisation in HfO2-Based FeFETs for In-Memory-Computing Applications Authors	Y Raffel, S De, M Lederer, R Olivo, R Hoffmann, S Thunder, Pirro, S L, Beyer, T Chohan, T Kämpfe, K Seidel, J Heitmann	ACS Applied Electronics Material
2022-07	期刊論文	READ-Optimized 28nm HKMG Multi-bit FeFET Synapses for Inference-Engine Applications	Sourav De, Franz Müller, Hoang-Hiep Le, Maximilian Lederer, Raffel Yannick, Tarek Ali, Darsen Lu, Thomas Kämpfe	IEEE Journal of the Electron Devices Society
2022-06	期刊論文	Bending Resistant Multi-bit Memristor for Flexible Precision Inference Engine Application	Parthasarathi Pal, King-Je Lee, Sunanda Thunder, Sourav De, Po-Tsang Huang, Yeong-Her Wang	IEEE Transaction of Electron Device
2022-05	研討會論文	Study of Nanosecond Laser Annealing on Silicon Doped Hafnium Oxide Film Crystallization and Capacitor Reliability	Tarek Ali, Ricardo Olivo, Sebastien Kerdiles, David Lehninger, Maximilian Lederer, Sourav De, Anne-Sophia Royet, Ayse Sünbül, Aditya Prabhu, Kati Kühnel, Malte Czernohorsky, Matthias Rudolph, Raik Hoffmann, Christelle Charpin-Nicolle, Laurent Grenouillet, Thomas Kämpfe, Konrad Seide
2022-04	研討會論文	Neuromorphic Computing with Fe-FinFETs in the Presence of Variation	Sourav De, Aftab Baig, Bo-Han Qiu, Hoang-Hiep Le, Yao-Jen Lee, Darsen Lu
2021-12	期刊論文	Compact model of retention characteristics of ferroelectric FinFET synapse with MFIS gate stack	Md Aftab Baig, Hoang-Hiep Le, Sourav De, Che-Wei Chang, Chia-Chi Hsieh, Xiao-Shan Huang, Yao-Jen Lee, Darsen D Lu	Semiconductor Science and Technology
2021-12	期刊論文	Random and Systematic Variation in Nanoscale Hf0.5Zr0.5O2 Ferroelectric FinFETs: Physical Origin and Neuromorphic Circuit Implications	Sourav De, Aftab Baig, Bo-Han Qiu, Franz Müller, Hoang-Hiep Le, Maximilian Lederer, Thomas Kämpfe, Tarek Ali, Po-Jung Sung, Chun-Jun Su, Yao-Jen Lee, Darsen D. Lu	Frontiers in Nanotechnology, Emerging Neuromorphic Electronics and Materials for Post-Moore Computing Era
2021-06	期刊論文	Robust binary neural network operation from 233 K to 398 K via gate stack and bias optimization of ferroelectric FinFET synapses	Sourav De, Hoang-Hiep Le, Bo-Han Qiu, Md Aftab Baig, Po-Jung Sung, Chun-Jung Su, Yao-Jen Lee, Darsen D Lu	IEEE Electron Device Letters
2021-06	研討會論文	Alleviation of Charge Trapping and Flicker Noise in HfZrO2-Based Ferroelectric Capacitors by Thermal Engineering Authors	Sourav De, Wei-Xuan Bu, Bo-Han Qiu, Chun-Jung Su, Yao-Jen Lee, Darsen D Lu
2021-06	研討會論文	Ultra-Low Power Robust 3bit/cell Hf0.5Zr0.5O2 Ferroelectric FinFET with High Endurance for Advanced Computing-In-Memory Technology	Sourav* De, Darsen Lu, Hoang-Hiep Le, Soumen Mazumder, Yao-Jen * Lee, Wei-Chih Tseng, Bo-Han Qiu, Md. Aftab Baig, Po-Jung Sung, Chung-Jun Su, Chien-Ting Wu, Wen-Fa Wu, Wen-Kuan Yeh, Yeong-Her Wang
2021-02	期刊論文	Uniform Crystal Formation and Electrical Variability Reduction in Hafnium-Oxide-Based Ferroelectric Memory by Thermal Engineering	Sourav De, Bo-Han Qiu, Wei-Xuan Bu, Mohammad Aftab Baig, Po-Jung Sung, Chun-Jung Su, Yao-Jen Lee, Darsen D Lu	ACS Applied Electronic Materials
2020-07	期刊論文	Computationally efficient compact model for ferroelectric field-effect transistors to simulate the online training of neural networks	Darsen Duane Lu, Sourav De, Mohammed Aftab Baig, Bo-Han Qiu, Yao-Jen Lee	Semiconductor Science and Technology, IOP Publishing
2020-06	研討會論文	Tri-Gate Ferroelectric FET Characterization and Modelling for Online Training of Neural Networks at Room Temperature and 233K	Sourav De, Aftab Baig, Bo-Han Qiu, Darsen Lu, Po-Jung Sung, Fu.K Hsueh, Yao-Jen Lee, Chun-Jung Su
2020-04	期刊論文	Compact model for PZT ferroelectric capacitors with voltage dependent switching behavior	Chien-Wei Wang, Hansol Ku, Cheng Yan Chiu, Sourav De, Bo-Han Qiu, Changhwan Shin, Darsen Lu	Semiconductor Science and Technology, IOP Publishing